smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.4.78-2-pve] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Western Digital Red Device Model: WDC WD20EFRX-68AX9N0 Serial Number: WD-WMC300654321 LU WWN Device Id: 5 0014ee 058d123a4 Firmware Version: 80.00A80 User Capacity: 2.000.398.934.016 bytes [2,00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Dec 23 12:45:04 2020 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART Status not supported: ATA return descriptor not supported by controller firmware SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (26280) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 266) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x70bd) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0027 174 173 021 Pre-fail Always - 4266 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 657 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 005 005 000 Old_age Always - 69539 10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 657 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 655 193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 1 194 Temperature_Celsius 0x0022 123 106 000 Old_age Always - 24 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0 SMART Error Log Version: 1 ATA Error Count: 323 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 323 occurred at disk power-on lifetime: 3990 hours (166 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 61 0c 00 00 00 00 Device Fault; Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ef 03 0c 00 00 00 00 00 6d+22:51:52.646 SET FEATURES [Set transfer mode] e5 00 00 00 00 00 00 00 6d+22:51:52.646 CHECK POWER MODE ec 00 00 00 00 00 00 00 6d+22:51:52.645 IDENTIFY DEVICE ef 03 0c 00 00 00 00 00 6d+22:51:52.396 SET FEATURES [Set transfer mode] e5 00 00 00 00 00 00 00 6d+22:51:52.396 CHECK POWER MODE Error 322 occurred at disk power-on lifetime: 3990 hours (166 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 61 0c 00 00 00 00 Device Fault; Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ef 03 0c 00 00 00 00 00 6d+22:51:52.396 SET FEATURES [Set transfer mode] e5 00 00 00 00 00 00 00 6d+22:51:52.396 CHECK POWER MODE ec 00 00 00 00 00 00 00 6d+22:51:52.396 IDENTIFY DEVICE ef 03 0c 00 00 00 00 00 6d+22:51:52.146 SET FEATURES [Set transfer mode] e5 00 00 00 00 00 00 00 6d+22:51:52.146 CHECK POWER MODE Error 321 occurred at disk power-on lifetime: 3990 hours (166 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 61 0c 00 00 00 00 Device Fault; Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ef 03 0c 00 00 00 00 00 6d+22:51:52.146 SET FEATURES [Set transfer mode] e5 00 00 00 00 00 00 00 6d+22:51:52.146 CHECK POWER MODE ec 00 00 00 00 00 00 00 6d+22:51:52.146 IDENTIFY DEVICE ef 03 0c 00 00 00 00 00 6d+22:51:51.896 SET FEATURES [Set transfer mode] e5 00 00 00 00 00 00 00 6d+22:51:51.896 CHECK POWER MODE Error 320 occurred at disk power-on lifetime: 3990 hours (166 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 61 0c 00 00 00 00 Device Fault; Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ef 03 0c 00 00 00 00 00 6d+22:51:51.896 SET FEATURES [Set transfer mode] e5 00 00 00 00 00 00 00 6d+22:51:51.896 CHECK POWER MODE ec 00 00 00 00 00 00 00 6d+22:51:51.896 IDENTIFY DEVICE ef 03 0c 00 00 00 00 00 6d+22:51:51.647 SET FEATURES [Set transfer mode] e5 00 00 00 00 00 00 00 6d+22:51:51.647 CHECK POWER MODE Error 319 occurred at disk power-on lifetime: 3990 hours (166 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 61 0c 00 00 00 00 Device Fault; Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ef 03 0c 00 00 00 00 00 6d+22:51:51.647 SET FEATURES [Set transfer mode] e5 00 00 00 00 00 00 00 6d+22:51:51.647 CHECK POWER MODE ec 00 00 00 00 00 00 00 6d+22:51:51.647 IDENTIFY DEVICE ef 03 0c 00 00 00 00 00 6d+22:51:51.647 SET FEATURES [Set transfer mode] e5 00 00 00 00 00 00 00 6d+22:51:51.647 CHECK POWER MODE SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.