193 lines
9.3 KiB
Plaintext
193 lines
9.3 KiB
Plaintext
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smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.4.78-2-pve] (local build)
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Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Western Digital Red
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Device Model: WDC WD20EFRX-68AX9N0
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Serial Number: WD-WMC300654321
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LU WWN Device Id: 5 0014ee 058d123a4
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Firmware Version: 80.00A80
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User Capacity: 2.000.398.934.016 bytes [2,00 TB]
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Sector Sizes: 512 bytes logical, 4096 bytes physical
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Device is: In smartctl database [for details use: -P show]
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ATA Version is: ACS-2 (minor revision not indicated)
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SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
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Local Time is: Wed Dec 23 12:45:04 2020 CET
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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=== START OF READ SMART DATA SECTION ===
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SMART Status not supported: ATA return descriptor not supported by controller firmware
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SMART overall-health self-assessment test result: PASSED
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Warning: This result is based on an Attribute check.
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: (26280) seconds.
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Offline data collection
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capabilities: (0x7b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 266) minutes.
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Conveyance self-test routine
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recommended polling time: ( 5) minutes.
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SCT capabilities: (0x70bd) SCT Status supported.
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SCT Error Recovery Control supported.
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SCT Feature Control supported.
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SCT Data Table supported.
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SMART Attributes Data Structure revision number: 16
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
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1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
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3 Spin_Up_Time 0x0027 174 173 021 Pre-fail Always - 4266
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4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 657
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5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
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7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
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9 Power_On_Hours 0x0032 005 005 000 Old_age Always - 69539
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10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
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11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
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12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 657
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192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 655
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193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 1
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194 Temperature_Celsius 0x0022 123 106 000 Old_age Always - 24
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196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
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197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
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198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
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199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
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200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
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SMART Error Log Version: 1
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ATA Error Count: 323 (device log contains only the most recent five errors)
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CR = Command Register [HEX]
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FR = Features Register [HEX]
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SC = Sector Count Register [HEX]
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SN = Sector Number Register [HEX]
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CL = Cylinder Low Register [HEX]
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CH = Cylinder High Register [HEX]
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DH = Device/Head Register [HEX]
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DC = Device Command Register [HEX]
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ER = Error register [HEX]
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ST = Status register [HEX]
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Powered_Up_Time is measured from power on, and printed as
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DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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Error 323 occurred at disk power-on lifetime: 3990 hours (166 days + 6 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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04 61 0c 00 00 00 00 Device Fault; Error: ABRT
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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ef 03 0c 00 00 00 00 00 6d+22:51:52.646 SET FEATURES [Set transfer mode]
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e5 00 00 00 00 00 00 00 6d+22:51:52.646 CHECK POWER MODE
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ec 00 00 00 00 00 00 00 6d+22:51:52.645 IDENTIFY DEVICE
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ef 03 0c 00 00 00 00 00 6d+22:51:52.396 SET FEATURES [Set transfer mode]
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e5 00 00 00 00 00 00 00 6d+22:51:52.396 CHECK POWER MODE
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Error 322 occurred at disk power-on lifetime: 3990 hours (166 days + 6 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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04 61 0c 00 00 00 00 Device Fault; Error: ABRT
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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ef 03 0c 00 00 00 00 00 6d+22:51:52.396 SET FEATURES [Set transfer mode]
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e5 00 00 00 00 00 00 00 6d+22:51:52.396 CHECK POWER MODE
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ec 00 00 00 00 00 00 00 6d+22:51:52.396 IDENTIFY DEVICE
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ef 03 0c 00 00 00 00 00 6d+22:51:52.146 SET FEATURES [Set transfer mode]
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e5 00 00 00 00 00 00 00 6d+22:51:52.146 CHECK POWER MODE
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Error 321 occurred at disk power-on lifetime: 3990 hours (166 days + 6 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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04 61 0c 00 00 00 00 Device Fault; Error: ABRT
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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ef 03 0c 00 00 00 00 00 6d+22:51:52.146 SET FEATURES [Set transfer mode]
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e5 00 00 00 00 00 00 00 6d+22:51:52.146 CHECK POWER MODE
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ec 00 00 00 00 00 00 00 6d+22:51:52.146 IDENTIFY DEVICE
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ef 03 0c 00 00 00 00 00 6d+22:51:51.896 SET FEATURES [Set transfer mode]
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e5 00 00 00 00 00 00 00 6d+22:51:51.896 CHECK POWER MODE
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Error 320 occurred at disk power-on lifetime: 3990 hours (166 days + 6 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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04 61 0c 00 00 00 00 Device Fault; Error: ABRT
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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ef 03 0c 00 00 00 00 00 6d+22:51:51.896 SET FEATURES [Set transfer mode]
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e5 00 00 00 00 00 00 00 6d+22:51:51.896 CHECK POWER MODE
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ec 00 00 00 00 00 00 00 6d+22:51:51.896 IDENTIFY DEVICE
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ef 03 0c 00 00 00 00 00 6d+22:51:51.647 SET FEATURES [Set transfer mode]
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e5 00 00 00 00 00 00 00 6d+22:51:51.647 CHECK POWER MODE
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Error 319 occurred at disk power-on lifetime: 3990 hours (166 days + 6 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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04 61 0c 00 00 00 00 Device Fault; Error: ABRT
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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ef 03 0c 00 00 00 00 00 6d+22:51:51.647 SET FEATURES [Set transfer mode]
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e5 00 00 00 00 00 00 00 6d+22:51:51.647 CHECK POWER MODE
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ec 00 00 00 00 00 00 00 6d+22:51:51.647 IDENTIFY DEVICE
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ef 03 0c 00 00 00 00 00 6d+22:51:51.647 SET FEATURES [Set transfer mode]
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e5 00 00 00 00 00 00 00 6d+22:51:51.647 CHECK POWER MODE
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SMART Self-test log structure revision number 1
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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